Lehigh Microscopy School - Lehigh Microscopy School Courses

Lehigh Microscopy School Courses

  • Ion-solid interaction theory will be introduced and used in describing methods of specimen preparation for SEM, TEM, AFM, Auger, SIMS, and atom probe. Other topics include 2D/3D FIB/SEM analytical characterization, milling/deposition techniques for nanotechnology, and advances in instrumentation.
    Full refund of the course if you cancel by May 15, 2025

     

    Price:

    $3,600.00