Focused Ion Beam (FIB): Instrumentation and Applications

This course is designed for those using or are interested in using the FIB or FIB/SEM platforms in academic, governmental, or industrial laboratories in either the physical or biological sciences. Basic ion-solid interaction theory will be introduced and used in describing methods of specimen preparation for SEM, TEM, AFM, Auger, SIMS, and atom probe. Other topics include 2D/3D FIB/SEM analytical characterization, milling/deposition techniques for nanotechnology, and advances in instrumentation.
**This course requires a minimum of 8 registrants by April 15 to proceed. Please hold off on making non-refundable travel plans until that time. Registrants will be notified by email.**