Lehigh Microscopy School Courses

  • This course provides a working knowledge of SEM and EDS X-ray microanalysis as well as an introduction to variable-pressure (environmental), high-resolution SEM, and low-voltage SEM.

    Price:

    $3,500.00

  • A one-day course designed for students who have not previously had hands-on experience of SEM or EDS analysis. It is a good primer course for those less experienced individuals to "get up to speed" before attending the main SEM Course.

    Price:

    $950.00

  • Ion-solid interaction theory will be introduced and used in describing methods of specimen preparation for SEM, TEM, AFM, Auger, SIMS, and atom probe. Other topics include 2D/3D FIB/SEM analytical characterization, milling/deposition techniques for nanotechnology, and advances in instrumentation.
     

    Price:

    $3,500.00

  • This course provides an overview of the concepts, instrumentation and application of TEM. It explores topics such as specimen preparation, TEM and STEM imaging modes, electron diffraction, EDS and EELS analysis, and processing of images and spectra.

     

    Price:

    $3,900.00