Main SEM & X-ray Microanalysis Course

This course is designed for individuals who use scanning electron microscopy and x-ray microanalysis in academic, governmental, or industrial laboratories: engineers, technicians, physical and biological scientists, clinicians, geologists, forensic scientists and technical managers. Through an integrated series of lectures and laboratory sessions, it will provide a working knowledge of the principles of these two related techniques as well as an introduction to variable-pressure (environmental) and low-voltage SEM. Lehigh’s SEM courses were founded by Joe Goldstein in 1970. Nearly a half-century later, the Lehigh Microscopy School is widely recognized as the largest and best in the world. Over 6,200 engineers, scientists, and technicians have taken our courses, from 50 states and 38 countries. Goldstein et al.'s SEM textbook, one of the textbooks provided in our courses, has worldwide sales of over 54,000 copies since its first publication in 1975.

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